Home ｜ Login ｜ Join Home > Research > Papers       논문명 Fault-Tolerant Architecture for Reliable Integrated Gate Drivers 학술지명 Journal of the Electron Devices Society 교신저자 First: Jongbin Kim 공동저자 Hoon-Ju Chung; Seung-Woo Lee 논문구분 SCI 논문번호 Vol. 7, No. 1 게재년월 2019.09 첨부파일